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AccuRad semiconductor radiation-effects testing and verification platform is now live
The platform leads with X-ray TID contract testing and adds device-application programs, TID-X instruments and laboratory integration.
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Technical progress and application insight
Follow developments in semiconductor radiation-effects methods, device applications, AccuRad products and platform services.
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Technical progress
TID bias conditions: turn device state into a reproducible test variable
Why DUT mapping, actual voltage and current, operating mode and timing make bias a core test variable.
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Neutron-irradiated silicon: routing NTD, neutron effects and X-ray TID
A clear distinction between NTD material doping, neutron displacement effects and X-ray total ionizing dose.
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